September 29, 2009 Diploma Thesis Open Access

Erfle, Joachim

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{
  "abstract": "<p>No description available (migrated from EKP Invenio record 45037)</p>", 
  "author": [
    {
      "family": "Erfle, Joachim"
    }
  ], 
  "id": "21883", 
  "issued": {
    "date-parts": [
      [
        2009, 
        9, 
        29
      ]
    ]
  }, 
  "title": "Entwicklungen f\u00fcr neue Siliziumstreifensensoren und deren Qualit\u00e4tskontrolle", 
  "type": "thesis"
}