Diploma Thesis Open Access

Entwicklungen für neue Siliziumstreifensensoren und deren Qualitätskontrolle

Erfle, Joachim

Thesis supervisor(s)

Müller, Thomas; de Boer, Wim

No description available (migrated from EKP Invenio record 45037)
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Publication date:
September 29, 2009
Awarding University:
Karlsruhe Institute of Technology (KIT)
Report Number:
IEKP-KA/2009-27
Communities:

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