Diploma Thesis Open Access

Einfluss von Strahlenschäden auf Siliziumstreifensensoren aus unterschiedlichen Grundmaterialien

Frech, Sabine

Thesis supervisor(s)

Müller, Thomas; De Boer, Wim; Dierlamm, Alexander

No description available (migrated from EKP Invenio record 48175)             
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Publication date:
December 14, 2012
Awarding University:
Karlsruhe Institute of Technology (KIT)
Report Number:
IEKP-KA/2012-21
Communities:

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